Atomic force microscopy (AFM) is a surface characterization instrument which utilizes a tip to “feel” the surface. AFM has great potential as a tool for materials science studies in that it not only is a tool to image the topography of solid surfaces at high resolution, but also characterizes the surface mechanical, electrical and other properties. Recently there is an increasing demand to characterize larger and more complex biomolecular systems, modern AFM techniques have experienced a great deal of progress in the evaluation of local mechanical properties and topography of the living cells at a high spatial resolution and force sensitivity. afm probe functionalization company https://www.matexcel.com/servi....ces/afm-probe-functi